| 1. | As an enhancement of these methods , current testing can increase the fault coverage and make higher the reliability of ics
作为这些方法的一个补充，电流测试方法能够提高故障的覆盖率，提高产品的可靠性。 |
| 2. | And , when coupled with functional testing , the fault coverage for the entire process is as good as or better than in - circuit testing alone
加上功能测试，这个过程中检测到的故障率要比单独进行在线测试故障发现率大。 |
| 3. | The transient power supply current ( iddt ) testing can detect some faults undetectable by any other test method , and increase fault coverage
瞬态电流测试方法可以测试一些其他测试方法无法检测的故障，进一步提高故障覆盖率。 |
| 4. | Through the simulative experiments about iddq detecting bridge faults in cmos and bicmos circuits , the fault coverage of iddq can be estimated
并对cmos电路与bicmos电路的桥接故障作了iddq检测仿真实验,分析了iddq检测的故障覆盖率。 |
| 5. | In this paper we use the bist in the testing of the ssrams in estarl according to the characteristics of the structure and get almost 100 % fault coverage
本文针对estar1内部ssram的结构特点，实现了存储器自测试，得到了将近100的故障覆盖率。 |
| 6. | Because most of the faults found at board test are manufacturing defects , fault coverage for mda tests is nearly as good as fault coverage for in - circuit tests
因为在板级测试中发现的大部分故障都是生产缺陷，生产缺陷分析测试到的故障几乎都可以覆盖在线测试所发现的问题。 |
| 7. | The conclusion is that by using ant algorithm , the fault coverage about near half standard circuits is best ; and the generation speed is very higher than strategate ' s
与现有测试生成器相比，基于蚂蚁算法的测试矢量生成结果中，有近一半的标准电路获得了最高的故障覆盖率；在生成速度方面远高于strategate等算法。 |
| 8. | The dynamic power supply current ( iddt ) is a new window through which we can observe the switching activities in digital circuits . iddt testing methods make possible further increasing the fault coverage
动态电流提供了一个观测电路内部开关性能的新的窗口，动态电流测试方法为进一步提高故障覆盖率提供了可能。 |
| 9. | The experimental results illuminate the hierarchical test generation algorithm can greatly decrease the scale of test sets ( about 66 % ) , but the fault coverage and time performance are lower than gate - level test generation
实验数据表明分层测试产生算法能大大压缩电路测试集（约为66 ） ，而故障覆盖率有略微下降，时间性能也有些许降低。 |
| 10. | These new methods adopt the circuit information contained in the power supply line current to realize the fault diagnosis . it can increase the fault coverage , reduce testing cost and improve the quality and reliability of ics
它通过从电源电流信号中提取有效的信息来进行故障诊断,能够提高故障覆盖率,降低测试成本并提高集成电路产品的质量与可靠性。 |
